Otski

A copper intrauterine device (IUD), also known as an intrauterine coil, copper coil, or non-hormonal IUD, is a form of long-acting reversible contraception and one of the most effective forms of birth control available. It can also be used for emergency contraception within five days of unprotected sex. The device is placed in the uterus and lasts up to twelve years, depending on the amount of copper present in the device. It may be used for contraception regardless of age or previous pregnancy, and may be placed immediately after a vaginal delivery, cesarean delivery, or surgical abortion. Following its removal, fertility quickly returns.

The copper intrauterine device (Cu-IUD) is a small, T-shaped plastic frame wrapped with copper wire, inserted into the uterus as a long-acting, reversible, non-hormonal contraceptive method that prevents pregnancy primarily through the spermicidal effects of released copper ions, which induce a local inflammatory response impairing sperm motility, viability, and fertilization capability.[1][2] Approved for use up to 10-12 years depending on the model, it exhibits high efficacy with a failure rate of less than 0.8% in the first year of typical use, outperforming many other contraceptive options while avoiding systemic hormonal exposure.[3][4] The device can also serve as emergency contraception when inserted within five days of unprotected intercourse, achieving over 99% effectiveness in preventing implantation of a fertilized egg.[5][6] Notable advantages include immediate reversibility upon removal and suitability for nulliparous women or those with contraindications to hormones, though empirical data indicate frequent side effects such as heavier menstrual bleeding and dysmenorrhea, leading to discontinuation rates of 10-15% within the first year, higher than hormonal alternatives.[3][7] Rare but serious risks encompass uterine perforation (1-2 per 1,000 insertions) and expulsion (2-10%), with causal evidence linking these to insertion technique and individual anatomical factors rather than inherent device flaws.[3][1]